Published 1996 | Version v1
Book

A CBLT and MCST capable VME slave interface

Description

We report on the development of a VME slave interface for the CLEO III detector implemented in an ALTERA EPM7256 CPLD. This includes the first implementation of the chained block transfer protocol (CBLT) and multi-cast cycles (MCST) as defined by the VME-P task group of VIPA. Within VME64 there is no operation that guarantees efficient readout of large blocks of data that are sparsely distributed among a series of slave modules in a VME crate. This has led the VME-P task group of VIPA to specify protocols that enable a master to address many slaves at a single address. Which slave is to drive the data bus is determined by a token passing mechanism that uses the *IACKOUT, *IACKIN daisy chain. This protocol requires no special features from the master besides conformance to VME64. Non-standard features are restricted to the VME slave interface. The CLEO III detector comprises ∼400,000 electronic channels that have to be digitized, sparsified, and stored within 20μs in order to incur less than 2% dead time at an anticipated trigger rate of 1000Hz. 95% of these channels are accounted for by only two detector subsystems, the silicon microstrip detector (125,000 channels), and the ring imaging Cerenkov detector (RICH) (230,400 channels). After sparsification either of these two detector subsystems is expected to provide event fragments on the order of 10KBytes, spread over 4, and 8 VME crates, respectively. We developed a chip set that sparsifies, tags, and stores the incoming digital data on the data boards, and includes a VME slave interface that implements MCST and CUT protocols. In this poster, we briefly describe this chip set and then discuss the VME slave interface in detail

Additional details

Publishing Information

Publisher
IEEE Service Center.
Imprint Place
Piscataway, NJ (United States)
Imprint Title
1996 IEEE nuclear science symposium - conference record. Volumes 1, 2 and 3
Imprint Pagination
2138 p.
Journal Page Range
p. 518-522.

Conference

Title
Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference.
Dates
2-9 Nov 1996.
Place
Anaheim, CA (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
28068901
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S42: ENGINEERING;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DATA ACQUISITION SYSTEMS; DESIGN; EQUIPMENT INTERFACES; INTEGRATED CIRCUITS; SHOWER COUNTERS
Descriptors DEC
ELECTRONIC CIRCUITS; MEASURING INSTRUMENTS; RADIATION DETECTORS

Optional Information

Secondary number(s)
CONF-961123--.