Published January 1973 | Version v1
Journal article Metadata-only

Dislocation interaction with irradiation damage in the high voltage electron microscope

Creators

  • 1. Cambridge Univ. (UK). Cavendish Lab.

Description

Abstract A form of the weak beam technique is described and shown to provide useful information about the dislocation interaction with the irradiation-produced point defects in the high voltage electron microscope. Possible mechanisms to explain the preliminary experimental observations are discussed.

Additional details

Identifiers

DOI
10.1080/14786437308228928;

Publishing Information

Journal Title
Philosophical Magazine
Journal Volume
27
Journal Issue
1
Series
Philos. Mag.
Journal Page Range
257-263
ISSN
0031-8086

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
4063410
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
No Abstract
Descriptors DEI
COPPER; DISLOCATIONS; ELECTRON MICROSCOPES; ELECTRONS; KEV RANGE 100-1000; POINT DEFECTS; RADIATION EFFECTS
Descriptors DEC
CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; FERMIONS; KEV RANGE; LEPTONS; LINE DEFECTS; METALS; MICROSCOPES; TRANSITION ELEMENTS

Optional Information

Notes
Letter-to-the-editor.; Updated automatically by Metadata and Full-Text Enrichment Agent