Radiation-induced swelling and softening in magnesium aluminate spinel irradiated with high-flux Cu- ions
Description
Magnesium aluminate spinel of single crystal was irradiated with 60 keV Cu- at a flux up to 6.2 x 1018 ions/m2 s, to a total fluence of 3 x 1020 ions/m2, in order to study changes in hardness and step-height swelling by high-flux implantation. Hardness determined by nano-indentation measurements steeply decreased with implantation. There is a strong negative correlation between flux dependences of the hardness and the step-height swelling: the former decreases as the latter increases. The Rutherford backscattering spectrometry (RBS)/channeling measurements showed that the spinel is not completely amorphized over the flux range in this study, and the radiation-induced softening observed is not due to amorphization. Results of optical absorbance suggested that radiation-induced point defects and their clusters on the anion sublattices of the spinel played an important role in the radiation-induced swelling under high-flux ion implantation
Additional details
Identifiers
- DOI
- 10.1016/j.jnucmat.2004.01.010;
- PII
- S0022311504000340;
Publishing Information
- Journal Title
- Journal of Nuclear Materials
- Journal Volume
- 326
- Journal Issue
- 2-3
- Journal Page Range
- p. 211-216
- ISSN
- 0022-3115
- CODEN
- JNUMAM
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35059637
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINATES; COPPER IONS; HARDNESS; ION BEAMS; ION IMPLANTATION; KEV RANGE 10-100; MAGNESIUM COMPOUNDS; MAGNESIUM OXIDES; MONOCRYSTALS; POINT DEFECTS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPINELS; STRAIN SOFTENING
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; ALUMINIUM COMPOUNDS; BEAMS; CHALCOGENIDES; CHARGED PARTICLES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; ENERGY RANGE; IONS; KEV RANGE; MAGNESIUM COMPOUNDS; MECHANICAL PROPERTIES; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.