Published February 17, 2014
| Version v1
Journal article
Lattice distortion in single crystal rare-earth arsenide/GaAs nanocomposites
- 1. Materials Department, University of California, Santa Barbara, California 93106-5050 (United States)
- 2. Department of Electrical and Computer Engineering, University of California, Santa Barbara, California 93106-9560 (United States)
Description
Epitaxial single crystal nanocomposites comprised of rare-earth arsenide nanoparticles embedded in GaAs (001) layers produce a larger change in lattice parameter than expected from the lattice parameters of relaxed films. Despite similar cubic structures and lattice parameters, elongation of the interfacial bond length between the two materials induces additional strain causing an expansion in the nanocomposite lattice. The interface bond length is material dependent with an average atomic layer spacing at the ErAs:GaAs interface of 1.9 Å while the spacing at the ScAs:GaAs interface is only 1.4 Å. Implications for lattice matching various single crystal epitaxial nanostructures in semiconductors are discussed
Additional details
Identifiers
- DOI
- 10.1063/1.4865905;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 104
- Journal Issue
- 7
- Journal Page Range
- p. 073114-073114.4
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45104496
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- BOND LENGTHS; COMPOSITE MATERIALS; EPITAXY; EUROPIUM ARSENIDES; GALLIUM ARSENIDES; HETEROJUNCTIONS; INTERFACES; LATTICE PARAMETERS; LAYERS; MONOCRYSTALS; NANOSTRUCTURES; SEMICONDUCTOR MATERIALS; STRAINS; THIN FILMS
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; CRYSTAL GROWTH METHODS; CRYSTALS; DIMENSIONS; EUROPIUM COMPOUNDS; FILMS; GALLIUM COMPOUNDS; LENGTH; MATERIALS; PNICTIDES; RARE EARTH COMPOUNDS; SEMICONDUCTOR JUNCTIONS
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC