Published June 2007 | Version v1
Journal article

Trace element AMS at NRL: Initial use of a modified SIMS ion source

  • 1. Code 6303, Naval Research Laboratory, 4555 Ovelook Ave Sw, Washington, DC 20375 (United States)
  • 2. Nova Research, Inc., Alexandria, VA 22308 (United States)

Description

There has been recent interest to attach a high-energy ion accelerator to the output of a secondary ion mass spectrometer (SIMS). NRL has undertaken such an effort, to improve the rejection of molecular ions and thus lower the limit of detection for masses above 90 Da. In this mass range molecules containing H, C, N, O and other light species that are present can create molecular interferences with M/ΔM values greater than 10,000. These create a background difficult to remove in conventional SIMS analysis. Using a tandem accelerator and a gas stripper cell, molecules can be broken apart, leaving only atomic ions to measure. By measuring the energy of collected ions, residual interferences caused by molecular fragments in altered charge states can be rejected. The NRL AMS facility provides a further enhancement, in that this system is designed to transmit ions in parallel over a broad mass range. This enables higher precision measurements, for example of isotope ratios, but also allows efficient and sensitive data collection over a relatively broad mass spectrum. This is important, for example, for Genesis Return Mission samples that have trapped solar wind atoms in the surface of collector plates of various materials. This paper presents initial results obtained using the new configuration of the NRL AMS system

Additional details

Identifiers

DOI
10.1016/j.nimb.2007.01.231;
PII
S0168-583X(07)00198-X;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
259
Journal Issue
1
Journal Page Range
p. 27-30
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
10. international conference on accelerator mass spectrometry
Dates
5-10 Sep 2005
Place
Berkeley, CA (United States)

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.