Composition and structure of a-C:Au nanocomposites obtained by physical vapour deposition
- 1. Fondazione Bruno Kessler, Centro per la Ricerca Scientifica e Tecnologica, 38100 Povo, Trento (Italy)
- 2. 'MATI'-RGTU, Moscow (Russian Federation)
- 3. RRC Kurchatov Institute, Moscow (Russian Federation)
Description
Physical vapour deposition (PVD) is considered to deposit a-C:Au thin films for electrochemical applications. The relevant point in this context is the ability to generate structures where Au nanoparticles are embedded in a-C in a stable way. Such a configuration would in fact enable one to increase the catalytic activity of Au by decreasing the Au cluster size. Investigation of the deposited films is performed by X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD). The two techniques consistently show that nanosized Au clusters, with a broad size distribution, are indeed formed within the a-C matrix. The cluster size depends on the Au concentration, and falls in the nanometer range for Au concentrations below the percolation threshold.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2008.07.066Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2008.07.066;
- PII
- S0169-4332(08)01663-2;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 255
- Journal Issue
- 5
- Journal Page Range
- p. 2214-2218
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41015304
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CARBON; COMPOSITE MATERIALS; ELECTROCHEMISTRY; GOLD; MAGNETRONS; NANOSTRUCTURES; PHYSICAL VAPOR DEPOSITION; SPUTTERING; THIN FILMS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHEMISTRY; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTRON SPECTROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; MATERIALS; METALS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NONMETALS; PHOTOELECTRON SPECTROSCOPY; SCATTERING; SPECTROSCOPY; SURFACE COATING; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.