Published May 26, 2004 | Version v1
Journal article

High-pressure structural and optical properties of wurtzite-type Zn1-xMgxSe

Description

High-pressure diffraction experiments for wurtzite-type zinc magnesium selenide were performed using a large-anvil X-ray diffraction press, MAX80, and synchrotron radiation. The pressure dependence of unit-cell parameters was determined for Zn0.53Mg0.47Se for pressures ranging up to 5.17 GPa. The value of bulk modulus and its pressure derivative were calculated from the pressure-volume dependence by fitting the Birch-Murnaghan equation of state (EOS). They are compared with reported data for ZnSe, MgSe and some related solid solutions. Photoluminescence (PL) data for Zn0.38Mg0.62Se were collected using a diamond-anvil cell at a lower pressure. These data show an evolution of the main deep-levels emission band: a narrowing of the spectrum, an increase of luminescence intensity and a blue shift

Additional details

Identifiers

DOI
10.1016/j.jallcom.2003.07.035;
PII
S0925838803011150;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
371
Journal Issue
1-2
Journal Page Range
p. 168-171
ISSN
0925-8388
CODEN
JALCEU

Conference

Title
Solid solutions of the II-VI compounds-growth, characterization and applications
Acronym
E-MRS 2002 Fall Meeting, Symposium G
Dates
14-18 Oct 2002
Place
Zakopane (Poland)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37049272
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRYSTALS; EQUATIONS OF STATE; MAGNESIUM COMPOUNDS; PRESSURE DEPENDENCE; PRESSURE RANGE GIGA PA; SELENIDES; SPECTRA; SYNCHROTRON RADIATION; X-RAY DIFFRACTION; ZINC SELENIDES
Descriptors DEC
ALKALINE EARTH METAL COMPOUNDS; BREMSSTRAHLUNG; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; EQUATIONS; PRESSURE RANGE; RADIATIONS; SCATTERING; SELENIDES; SELENIUM COMPOUNDS; ZINC COMPOUNDS

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.