Published July 29, 2002
| Version v1
Journal article
Microscopic probabilistic model for the simulation of secondary electron emission
Description
We provide a detailed description of a model and its computational algorithm for the secondary electron emission process. The model is based on a broad phenomenological fit to data for the secondary emission yield (SEY) and the emitted-energy spectrum. We provide two sets of values for the parameters by fitting our model to two particular data sets, one for copper and the other one for stainless steel
Additional details
Publishing Information
- Journal Title
- Physical Review Special Topics. Accelerators and Beams
- Journal Volume
- 512
- Journal Issue
- 12
- Journal Page Range
- [10 p.]
- ISSN
- 1098-4402
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 35076749
- Subject category
- S36: MATERIALS SCIENCE; S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- ALGORITHMS; COPPER; ELECTRON EMISSION; SECONDARY EMISSION; SIMULATION; STAINLESS STEELS
- Descriptors DEC
- ALLOYS; CARBON ADDITIONS; ELEMENTS; EMISSION; HIGH ALLOY STEELS; IRON ALLOYS; IRON BASE ALLOYS; MATHEMATICAL LOGIC; METALS; STEELS; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENTS
Optional Information
- Contract/Grant/Project number
- AC03-76SF00098
- Notes
- Journal Publication Date: 12/2002
- Funding organization
- USDOE Director, Office of Science. Office of High Energy and Nuclear Physics. Division of High Energy Physics (United States)
- Secondary number(s)
- LBNL--49771; CBP-note--415