The effect of detector performance on high countrate PET imaging with a tomograph based on position-sensitive detectors
Creators
- 1. Hospital of the Univ. of Pennsylvania, Dept. of Radiology, 3400 Spruce St., Philadelphia, PA (USA)
Description
During dynamic studies, ECT systems employing large position-sensitive detectors are forced to handle high event rates per detector. Since detector performance is likely to change with data rate, it is important to understand the effect of changes in detector behavior on image quality. To determine the ability of the PENN-PET tomograph to perform high countrate scans, the authors studied detector performance up to singles rates in excess of 2 million counts per second per detector. In order to evaluate the quality of images resulting from data acquired at these rates, signal-to-noise ratio analyses were applied to both simulated and experimental high countrate images of a cold spot phantom. Changes in image quality were quantitated, allowing us to test combinations of high countrate event processing techniques to produce optimal high countrate images
Additional details
Publishing Information
- Journal Title
- IEEE Trans. Nucl. Sci.
- Journal Volume
- 35
- Journal Issue
- 1
- Series
- IEEE Trans. Nucl. Sci.
- Journal Page Range
- 592-597
- ISSN
- 0018-9499
- CODEN
- IETNA
Conference
- Title
- 34. nuclear science symposium and 19. nuclear power systems symposium.
- Dates
- 21-23 Oct 1987.
- Place
- San Francisco, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 19084913
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S61: RADIATION PROTECTION AND DOSIMETRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DATA ACQUISITION; DATA PROCESSING; DYNAMIC FUNCTION STUDIES; IMAGE PROCESSING; IMAGE SCANNERS; OPTIMIZATION; PERFORMANCE TESTING; PHANTOMS; POSITRON COMPUTED TOMOGRAPHY; POSITRONS; QUALITY CONTROL; RADIATION DETECTORS; SIGNAL-TO-NOISE RATIO
- Descriptors DEC
- ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; COMPUTERIZED TOMOGRAPHY; CONTROL; ELEMENTARY PARTICLES; EMISSION COMPUTED TOMOGRAPHY; FERMIONS; LEPTONS; MATTER; MEASURING INSTRUMENTS; MOCKUP; STRUCTURAL MODELS; TESTING; TOMOGRAPHY
Optional Information
- Secondary number(s)
- CONF-871006--.