Published December 15, 2009 | Version v1
Journal article

On the implementation of nano-structured materials in surface plasmon resonance sensors

  • 1. Department of Physics, University of Patras, GR 26 500, Patras (Greece)

Description

In this work, we review the implementation of nano-structured materials in surface plasmon resonance (SPR) sensors for the detection of adsorbed molecules. More specifically, we study nano-porous alumina films supported by gold (Au) or aluminum (Al) thin films in SPR sensors under the Kretchmann configuration. The enhanced response of such a sensor is calculated by theoretical simulation and is compared to the most widely used 'classic' Au SPR sensor. It is concluded that both Al/nano-porous alumina and Au/nano-porous alumina setup provide better response than the 'classic' Au SPR sensor with Au/nano-porous alumina setup providing the best response.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.mseb.2009.02.011

Additional details

Identifiers

DOI
10.1016/j.mseb.2009.02.011;
PII
S0921-5107(09)00095-6;

Publishing Information

Journal Title
Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
Journal Volume
165
Journal Issue
3
Journal Page Range
p. 270-273
ISSN
0921-5107
CODEN
MSBTEK

Conference

Title
5. international workshop on nanosciences and nanotechnologies
Acronym
NN08
Dates
14-16 Jul 2008
Place
Thessaloniki (Greece)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41077658
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ADSORPTION; ALUMINIUM; ALUMINIUM OXIDES; CONFIGURATION; DETECTION; GOLD; IMPLEMENTATION; MOLECULES; NANOSTRUCTURES; PLASMONS; POROUS MATERIALS; RESONANCE; REVIEWS; SENSORS; SIMULATION; SURFACES; THIN FILMS
Descriptors DEC
ALUMINIUM COMPOUNDS; CHALCOGENIDES; DOCUMENT TYPES; ELEMENTS; FILMS; MATERIALS; METALS; OXIDES; OXYGEN COMPOUNDS; QUASI PARTICLES; SORPTION; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.