Published November 2006 | Version v1
Journal article

Electron beam deflection with channeling in a silicon crystal at the REFER electron ring

  • 1. Graduate School of Advanced Sciences of Matter, Hiroshima University, Higashi-Hiroshima 739-8530 (Japan)
  • 2. Venture Business Laboratory, 2-313 Kagamiyama, Higashi-Hiroshima 739-8527 (Japan)
  • 3. High Energy Accelerator Research Organization KEK, 1-1 Oho, Tsukuba, Ibaraki 305-0801 (Japan)

Description

A new result on the deflection of 150 MeV electron beams with using the <1 0 0> axis of a silicon crystal is presented. The channeling effect of electrons passed through the crystal was clearly seen. We also studied dependence of the deflection on the beam divergence. The simulation qualitatively agreed with the experimental data

Additional details

Identifiers

DOI
10.1016/j.nimb.2006.07.011;
PII
S0168-583X(06)00853-6;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
252
Journal Issue
1
Journal Page Range
p. 16-19
ISSN
0168-583X
CODEN
NIMBEU

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38040780
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
CHANNELING; CRYSTALS; ELECTRON BEAMS; ELECTRON RINGS; ELECTRONS; MEV RANGE 100-1000; SILICON; SIMULATION
Descriptors DEC
BEAMS; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; FERMIONS; LEPTON BEAMS; LEPTONS; MEV RANGE; PARTICLE BEAMS; SEMIMETALS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.