Analysis of the mechanical properties and deformation behavior of nanostructured commercially pure Al processed by equal channel angular pressing (ECAP)
- 1. Department of Materials Science and Engineering, School of Engineering, Shiraz University, Shiraz (Iran, Islamic Republic of)
- 2. Department of Adaptive Machine Systems, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871 (Japan)
Description
In the present paper commercially pure Al was processed by equal channel angular pressing (ECAP) up to 8 passes using route BC. For ECAP processing a proper die set was designed and constructed. Transmission electron microscope (TEM) and electron backscatter diffraction (EBSD) were used to evaluate the microstructure of the pressed materials. Mechanical properties and the deformation behavior of the ECAP processed material were investigated by the hardness and compression tests. The significant increase in hardness and yield stress after ECAP was discussed by two strengthening mechanisms. Based on these mechanisms, variations of the hardness and yield stress as a function of the pass numbers were related to the calculated dislocation densities and the average boundary spacing. Also it was suggested that the absorption of the dislocations into grain boundaries would be an effective recovery process for the absence of the strain hardening
Availability note (English)
Available from http://dx.doi.org/10.1016/j.msea.2007.04.075Additional details
Identifiers
- DOI
- 10.1016/j.msea.2007.04.075;
- PII
- S0921-5093(07)00727-7;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 473
- Journal Issue
- 1-2
- Journal Page Range
- p. 189-194
- ISSN
- 0921-5093
- CODEN
- MSAPE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39068733
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION; ALUMINIUM; BACKSCATTERING; DEFORMATION; DISLOCATIONS; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; HARDNESS; NANOSTRUCTURES; PRESSING; STRAIN HARDENING; STRESSES; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; FABRICATION; HARDENING; LINE DEFECTS; MATERIALS WORKING; MECHANICAL PROPERTIES; METALS; MICROSCOPY; MICROSTRUCTURE; SCATTERING; SORPTION
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.