High-responsivity thermoelectric infrared detectors with stand-alone sub-micrometer polysilicon wires
- 1. Dynamic Microsystems Lab, Department of Electrical and Computer Engineering, University of Central Florida, FL (United States)
Description
A novel high-responsivity uncooled thermoelectric (TE) infrared (IR) detector is designed, fabricated and characterized. This detector features a single stand-alone polysilicon-based thermocouple (without a supporting membrane) covered by an umbrella-like optical cavity IR absorber. It is proved that the highest responsivity in the developed detectors can be achieved with only one thermocouple. Using a single thermocouple also results in a low resistance detector, which consequently limits the Johnson noise (e.g. less than 30 nv/√Hz in this work). Since the sub-micrometer polysilicon TE wires are the only heat path from the hot junction to the substrate, a superior thermal isolation is achieved. A responsivity of 1800 V W−1 and a detectivity of 2* 108 (cm Hz1/2 W−1) are measured from a 20 × 20 µm detector comparable to the performance of detectors used in commercial focal planar arrays [1]. This performance in a compact and manufacturable design elevates the position of thermoelectric IR sensors as a candidate for low-power, high performance and inexpensive focal planar arrays. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0960-1317/24/12/125013Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Micromechanics and Microengineering. Structures, Devices and Systems
- Journal Volume
- 24
- Journal Issue
- 12
- Journal Page Range
- [9 p.]
- ISSN
- 0960-1317
- CODEN
- JMMIEZ
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47057975
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; CRYSTAL DEFECTS; HEAT; INFRARED SPECTROMETERS; MEMBRANES; NOISE; PERFORMANCE; SENSORS; SILICON; SUBSTRATES; THERMOCOUPLES; WIRES
- Descriptors DEC
- CRYSTAL STRUCTURE; ELEMENTS; ENERGY; EVALUATION; MEASURING INSTRUMENTS; SEMIMETALS; SPECTROMETERS