Published December 1, 2014 | Version v1
Journal article

High-responsivity thermoelectric infrared detectors with stand-alone sub-micrometer polysilicon wires

  • 1. Dynamic Microsystems Lab, Department of Electrical and Computer Engineering, University of Central Florida, FL (United States)

Description

A novel high-responsivity uncooled thermoelectric (TE) infrared (IR) detector is designed, fabricated and characterized. This detector features a single stand-alone polysilicon-based thermocouple (without a supporting membrane) covered by an umbrella-like optical cavity IR absorber. It is proved that the highest responsivity in the developed detectors can be achieved with only one thermocouple. Using a single thermocouple also results in a low resistance detector, which consequently limits the Johnson noise (e.g. less than 30 nv/√Hz in this work). Since the sub-micrometer polysilicon TE wires are the only heat path from the hot junction to the substrate, a superior thermal isolation is achieved. A responsivity of 1800 V W−1 and a detectivity of 2* 108 (cm Hz1/2 W−1) are measured from a 20  ×  20 µm detector comparable to the performance of detectors used in commercial focal planar arrays [1]. This performance in a compact and manufacturable design elevates the position of thermoelectric IR sensors as a candidate for low-power, high performance and inexpensive focal planar arrays. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0960-1317/24/12/125013

Additional details

Publishing Information

Journal Title
Journal of Micromechanics and Microengineering. Structures, Devices and Systems
Journal Volume
24
Journal Issue
12
Journal Page Range
[9 p.]
ISSN
0960-1317
CODEN
JMMIEZ

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47057975
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
COMPARATIVE EVALUATIONS; CRYSTAL DEFECTS; HEAT; INFRARED SPECTROMETERS; MEMBRANES; NOISE; PERFORMANCE; SENSORS; SILICON; SUBSTRATES; THERMOCOUPLES; WIRES
Descriptors DEC
CRYSTAL STRUCTURE; ELEMENTS; ENERGY; EVALUATION; MEASURING INSTRUMENTS; SEMIMETALS; SPECTROMETERS