Applied software for microprocessor multielement X-ray radiometric analyzers
Description
A packet of applied programs FA-3 for application in 8-bit microsystems used for multi-element x-ray radiometric analyzer designs is described. Principles of program packet incorporation into particular equipment are shown. The considered version of FA-3 program packet is designed for realization of analyzers based on proportional counters. Algorithms of an automatic search for peaks and automatic analyser stabilization are presented. Taking a portable multi-element RAP-1M analyzer as an example it is shown that application of a ready FA-3 program packet allows one to reduce time required for its software approximately 50-fold if one uses concentration calculation methods incorporated into it and 25-fold-under their independent programming. Further it is assumed to develop new versions of applied FA-3 program packet. In particular, FA-4 paket for operation with a semiconductor detector will be developed in the nearest future. A possibility of incorporating graphics for laboratory analyzers into the program packets is considered
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19095996.pdf
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Additional details
Additional titles
- Original title (Russian)
- Прикладное программное обеспечение для микропроцессорных многоэлементных рентгенорадиометрических анализаторов
Publishing Information
- Imprint Title
- Radiation technology
- Journal Issue
- no.2(35
- Series
- Voprosy atomnoj nauki i tekhniki.
- Journal Page Range
- p. 33-36.
- Report number
- INIS-SU--58
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 19095996
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S99: GENERAL AND MISCELLANEOUS;
- Descriptors DEI
- CALIBRATION; F CODES; FLOWSHEETS; MICROPROCESSORS; MULTI-ELEMENT ANALYSIS; PORTABLE EQUIPMENT; PROPORTIONAL COUNTERS; SPECTRA UNFOLDING; TUNING; X-RAY RADIOGRAPHY; X-RAY SPECTROMETERS
- Descriptors DEC
- CHEMICAL ANALYSIS; COMPUTER CODES; DATA PROCESSING; DIAGRAMS; ELECTRONIC CIRCUITS; EQUIPMENT; INFORMATION; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; RADIATION DETECTORS; SPECTROMETERS
Optional Information
- Notes
- 7 refs.; 2 figs. Imprint:Radiatsionnaya tekhnika.;Nauchno-tekhnicheskij sbornik.