Published April 1981 | Version v1
Journal article

Single and multiple electron loss processes in MeV heavy ion-target collisions

Creators

  • 1. Oak Ridge Natl Lab, Tenn

Description

Experimental data, derived from the study of interactions between Mev heavy ions and gaseous targets, are presented which illustrate important physical aspects such as the dependence of cross sections on projectile velocity, and projectile and target atomic numbers. Included are data which reflect the importance of the electron binding energy, the existence of shell effects, the possibility of target polarizability, and the presence of non-additivity and density effects in electron loss processes. Charge state yield versus scattering angle, a prescription for relating total single electron loss cross section per atom, atomic and molecular target data and formulas which predict electron loss cross sections with reasonable accuracy are also given. 28 refs

Additional details

Publishing Information

Journal Title
IEEE Trans. Nucl. Sci.
Journal Volume
NS-28
Journal Issue
2
Series
IEEE Trans. Nucl. Sci.
Journal Page Range
1043-1052
ISSN
0018-9499

Conference

Title
6. conference on application of accelerators in research and industry.
Dates
Nov 1980.
Place
Denton, TX, USA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
13676356
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CROSS SECTIONS; ELECTRON LOSS; HEAVY IONS; ION COLLISIONS; MEV RANGE; SCATTERING
Descriptors DEC
CHARGED PARTICLES; COLLISIONS; ENERGY RANGE; IONS

Optional Information

Secondary number(s)
CONF-801111--.