Jc distribution measurement and analysis on superconducting bulk using 'Magnetoscan' method
Creators
- 1. Faculty of Engineering, Iwate University, 4-3-5 Ueda, Morioka 020-8551 (Japan)
Description
We investigated experimentally and theoretically by the 'Magnetoscan' technique. The Hall probe should be scanned as near as possible on the surface. The scan of the permanent magnet causes the field trap on the bulk. The field trap seriously influences the magnetoscan signal detected by Hall probe. We have investigated the detection of the crystal defects and/or inhomogeneity of critical current density (Jc) in superconducting bulk experimentally and theoretically by the 'Magnetoscan' technique. To detect them sensitively, the Hall probe located near the permanent magnet should be scanned as near as possible on the surface of the superconducting bulk. The scan of the permanent magnet causes the field trap on the bulk, which seriously influences the magnetoscan signal detected by Hall probe.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physc.2011.05.082Additional details
Identifiers
- DOI
- 10.1016/j.physc.2011.05.082;
- PII
- S0921-4534(11)00169-9;
Publishing Information
- Journal Title
- Physica. C, Superconductivity
- Journal Volume
- 471
- Journal Issue
- 21-22
- Journal Page Range
- p. 893-896
- ISSN
- 0921-4534
- CODEN
- PHYCE6
Conference
- Title
- 23. international symposium on superconductivity
- Dates
- 1-3 Nov 2010
- Place
- Tsukuba (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43072443
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRITICAL CURRENT; CRYSTAL DEFECTS; CURRENT DENSITY; DETECTION; DISTRIBUTION; HALL EFFECT; PERMANENT MAGNETS; PROBES; SIGNALS; SUPERCONDUCTORS; SURFACES; TRAPS
- Descriptors DEC
- CRYSTAL STRUCTURE; CURRENTS; ELECTRIC CURRENTS; EQUIPMENT; MAGNETS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.