Published July 2016
| Version v1
Journal article
Determination of Ta content in V-Ta alloy by EDXRF
- 1. Institute of Materials, China Academy of Engineering Physics P.O., Jiangyou (China)
Description
A simple, fast, and accurate analytical method of determining Ta content in V-Ta alloy was established by adopting Energy-dispersive X-ray fluorescence spectrometric (EDXRF). In the measurements, swarf from V-Ta alloy was dissolved and then absorbed by filter papers. Subsequently, the obtained filter paper samples were measured by EDXRF to determine Ta content. The relative standard deviation (n = 6) of this analytical method is less than 1%, when the Ta content of test samples ranges from 25% to 40%. (authors)
Additional details
Publishing Information
- Journal Title
- Nuclear Electronics and Detection Technology
- Journal Volume
- 36
- Journal Issue
- 7
- Journal Page Range
- p. 710-713
- ISSN
- 0258-0934
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 53032547
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CHEMICAL ANALYSIS; MEASURING METHODS; TANTALUM; TANTALUM ALLOYS; VANADIUM ALLOYS; X RADIATION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- ALLOYS; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; METALS; NONDESTRUCTIVE ANALYSIS; RADIATIONS; REFRACTORY METALS; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 1 fig., 4 tabs., 10 refs.