Published March 2013 | Version v1
Journal article

Alpha spectrometry study on LR 115 and Makrofol through measurements of track diameter

  • 1. Departamento de Raios Cósmicos e Cronologia, Instituto de Física Gleb Wataghin, UNICAMP, Campinas, SP (Brazil)

Description

Measurements of alpha track etch-pit diameters (from a 241Am source) are reported for CR-39, LR 115 and Makrofol detectors. The first detector was used to calibrate the source, whereas the possibility of alpha spectroscopy was investigated in the others. A 226Ra source was also used for CR-39 to detect a higher energy (≈6.96 MeV). The data found for CR-39 are in agreement with previous results. LR 115 and Makrofol presented the characteristic Bragg peak, which indicates that these detectors can be used as alpha spectrometers. Finally, within the applied etching conditions, it was possible to observe energy detection windows for LR 115 and Makrofol. For the etching conditions employed in this work, maximum energy thresholds were found to be approximately 4.5 MeV and 3.7 MeV, for LR 115 and Makrofol, respectively. Therefore, our results indicate alpha particle tracks from plated-out radon progeny would be naturally excluded if these detectors were used to monitor environmental radon and its progeny, confirming previous results performed with different experimental conditions. - Highlights: ► Alpha spectrometry through track diameter was investigated in plastic detectors. ► CR-39 was used to calibrate the 241Am source. ► Makrofol and LR-115 presented energy detection window, avoiding the plate-out effect. ► Spectrometry in Makrofol was achieved with ordinary chemical etching

Availability note (English)

Available from http://dx.doi.org/10.1016/j.radmeas.2012.06.010

Additional details

Identifiers

DOI
10.1016/j.radmeas.2012.06.010;
PII
S1350-4487(12)00179-5;

Publishing Information

Journal Title
Radiation Measurements
Journal Volume
50
Journal Page Range
p. 246-248
ISSN
1350-4487
CODEN
RMEAEP

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.