Total reflection X-ray fluorescence and its applications in elemental characterization and speciation of nuclear materials

We are using TXRF for research and development activities involving nuclear materials for trace element determinations of different elements using different sample preparation methodologies. We have applied this technique for trace determinations in actinide oxides for the elements P to U using normal sample chamber and Mo Kα excitation. Recently a TXRF spectrometer with vacuum sample chamber and Cr Kα excitation has been installed in our laboratory. It has two sample excitation sources: Cr Kα and Rh Kα. Using these two sources the elemental range of TXRF determinations could be extended to C - U. If we use different sample excitation energies for sample excitation and measure the emitted X-rays for the sample using exciting radiations below and above the absorption edges, the X-ray Absorption Fine Structure (XAFS) and X-ray Absorption Near Edge Spectrum (XANES) of a particular element in a sample can be probed to determine local environment of the atom as well as its oxidation state. However, such activity shall require synchrotron light source. We have used TXRF- XANES to probe the mixed valency of uranium in its oxides using the Microfocus beamline of Indus 2 synchrotron light source of the Department. A brief description of the TXRF Spectrometry, its applications in different areas of science and technology and R and D activities carried out in our laboratory shall be discussed in present talk