Published May 6, 2008
| Version v1
Journal article
Preparation and characterization of germanium oxysulfide glassy films for optics
Creators
- 1. School of Materials Science and Engineering, Clemson University, 161 Sirrine Hall, Box 340971, Clemson, SC 29634 (United States)
- 2. Institut de Chimie de la Matiere Condensee de Bordeaux, CNRS-Universite Bordeaux 1, 87 Av. Dr. Schweitzer, 33608 Pessac (France)
- 3. Institut des Sciences Moleculaires, UMR 5255 CNRS, Universite Bordeaux 1, 351 Cours de la Liberation, 33405 Talence (France)
- 4. Sciences Chimiques de Rennes, UMR-CNRS 6226, Equipe Verres and Ceramiques, Universite de Rennes 1, Campus de Beaulieu, 35042 Rennes Cedex (France)
- 5. Centre de Physique Moleculaire Optique et Hertzienne (CPMOH), CNRS-UMR 5798, 351 cours de la Liberation, 33405 Talence Cedex (France)
Description
Homogeneous amorphous films in the GeS2-GeO2 system have been deposited by a rf sputtering technique. Optical characterizations have shown that the cut-off wavelength and the linear indices increase with an increase in the S/O ratio. Raman spectroscopy indicates the presence of new modes that can be assigned to intermediate germanium oxysulfide structural units. Photo-sensitivity of the oxysulfide films has been demonstrated for irradiation near the band-gap. Diffraction gratings inscribed using 488 nm exposure displayed a limited diffraction efficiency (≤3%) that weakens with a corresponding decrease in the glass S/O ratio
Availability note (English)
Available from http://dx.doi.org/10.1016/j.materresbull.2007.05.032Additional details
Identifiers
- DOI
- 10.1016/j.materresbull.2007.05.032;
- PII
- S0025-5408(07)00233-4;
Publishing Information
- Journal Title
- Materials Research Bulletin
- Journal Volume
- 43
- Journal Issue
- 5
- Journal Page Range
- p. 1179-1187
- ISSN
- 0025-5408
- CODEN
- MRBUAC
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40023907
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DIFFRACTION GRATINGS; GERMANIUM COMPOUNDS; GERMANIUM OXIDES; GERMANIUM SULFIDES; GLASS; IRRADIATION; OPTICAL PROPERTIES; OXYSULFIDES; RAMAN SPECTROSCOPY; SENSITIVITY; SPUTTERING; THIN FILMS
- Descriptors DEC
- CHALCOGENIDES; FILMS; GERMANIUM COMPOUNDS; LASER SPECTROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SPECTROSCOPY; SULFIDES; SULFUR COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.