Published February 1989 | Version v1
Journal article

An ultra high throughput ADC

  • 1. SEIKO EG and G Co., Ltd., Tokyo (Japan)

Description

An ultra high throughput ADC for use with high resolution photon detectors has been developed. The ADC has 13 bit resolution with less than 0.7% differential non-linearity. A 12 bit, commercially available, hybrid ADC circuit has been used with a two step conversion technique. Improved version of the Gatti slider technique is also used to improve the differential non-linearity. Conversion time of 2 micro second is achieved

Additional details

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
36
Journal Issue
1
Series
IEEE Trans. Nucl. Sci.
Journal Page Range
653-656
ISSN
0018-9499
CODEN
IETNA

Conference

Title
IEEE nuclear science symposium.
Dates
9-11 Nov 1988.
Place
Orlando, FL (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
20053078
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S99: GENERAL AND MISCELLANEOUS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANALOG-TO-DIGITAL CONVERTERS; DATA TRANSMISSION; PHOTOELECTRON COUNTING; RADIATION DETECTORS; SPECIFICATIONS
Descriptors DEC
COMMUNICATIONS; COUNTING TECHNIQUES; ELECTRONIC EQUIPMENT; EQUIPMENT; MEASURING INSTRUMENTS

Optional Information

Secondary number(s)
CONF-881103--.