Published July 30, 2006
| Version v1
Journal article
Mass accuracy-TOF-SIMS
Creators
- 1. Quality of Life Division, National Physical Laboratory, Teddington, Middlesex TW11 0LW (United Kingdom)
Description
A study is presented of the factors affecting the calibration of the mass scale for time-of-flight SIMS (TOF-SIMS). The effect of the ion kinetic energy, emission angle and other instrumental operating parameters on the measured peak position are determined. This shows clearly why molecular and atomic ions have different relative peak positions and the need for an aperture to restrict ions at large emission angles. A calibration protocol is developed which gives a fractional mass accuracy of better than 10 ppm for masses up to 140 u. The effects of extrapolation beyond the calibration range are discussed and a recommended procedure is given to ensure that accurate mass is achieved within a selectable uncertainty for large molecules
Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2006.02.096;
- PII
- S0169-4332(06)00380-1;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 252
- Journal Issue
- 19
- Journal Page Range
- p. 6591-6593
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 15. International conference on secondary ion mass spectrometry
- Acronym
- SIMS XV
- Dates
- 12-16 Oct 2005
- Place
- Manchester (United Kingdom)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38104124
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; ATOMIC IONS; CALIBRATION; EXTRAPOLATION; ION EMISSION; ION MICROPROBE ANALYSIS; KINETIC ENERGY; MASS SPECTROSCOPY; TIME-OF-FLIGHT METHOD
- Descriptors DEC
- CHARGED PARTICLES; CHEMICAL ANALYSIS; EMISSION; ENERGY; IONS; MATHEMATICAL SOLUTIONS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; NUMERICAL SOLUTION; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.