Portable TXRF Spectrometer with 10-11g Detection Limit and Portable XRF Spectromicroscope with Sub-mm Spatial Resolution
- 1. Department of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto, 606-8501 (Japan)
Description
A portable total reflection X-ray fluorescence (TXRF) spectrometer that we have developed is applied to trace elemental analysis of water solutions. Although a 5 W X-ray tube is used in the portable TXRF spectrometer, detection limits of several ppb are achieved for 3d transition metal elements and trace elements in a leaching solution of soils, a leaching solution of solder, and alcoholic beverages are detected. Portable X-ray fluorescence (XRF) spectromicroscopes with a 1 W X-ray tube and an 8 W X-ray tube are also presented. Using the portable XRF spectromicroscope with the 1 W X-ray tube, 93 ppm of Cr is detected with an about 700 μm spatial resolution. Spatially resolved elemental analysis of a mug painted with blue, red, green, and white is performed using the two portable spectromicroscopes, and the difference in elemental composition at each paint is detected.
Additional details
Identifiers
- DOI
- 10.1063/1.3399251;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1221
- Journal Issue
- 1
- Journal Page Range
- p. 24-29
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 20. international congress on X-ray optics and microanalysis
- Dates
- 15-18 Sep 2009
- Place
- Karlsruhe (Germany)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41102216
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; AQUEOUS SOLUTIONS; BEVERAGES; CHROMIUM; MULTI-ELEMENT ANALYSIS; PAINTS; PORTABLE EQUIPMENT; QUANTITATIVE CHEMICAL ANALYSIS; SENSITIVITY; SOILS; SPATIAL RESOLUTION; SYNCHROTRON RADIATION; TRACE AMOUNTS; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- BREMSSTRAHLUNG; CHEMICAL ANALYSIS; COATINGS; DISPERSIONS; ELECTROMAGNETIC RADIATION; ELEMENTS; EQUIPMENT; FOOD; HOMOGENEOUS MIXTURES; METALS; MIXTURES; NONDESTRUCTIVE ANALYSIS; RADIATIONS; RESOLUTION; SOLUTIONS; SPECTROSCOPY; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- (c) 2010 American Institute of Physics