Published April 6, 2010 | Version v1
Journal article

Portable TXRF Spectrometer with 10-11g Detection Limit and Portable XRF Spectromicroscope with Sub-mm Spatial Resolution

  • 1. Department of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto, 606-8501 (Japan)

Description

A portable total reflection X-ray fluorescence (TXRF) spectrometer that we have developed is applied to trace elemental analysis of water solutions. Although a 5 W X-ray tube is used in the portable TXRF spectrometer, detection limits of several ppb are achieved for 3d transition metal elements and trace elements in a leaching solution of soils, a leaching solution of solder, and alcoholic beverages are detected. Portable X-ray fluorescence (XRF) spectromicroscopes with a 1 W X-ray tube and an 8 W X-ray tube are also presented. Using the portable XRF spectromicroscope with the 1 W X-ray tube, 93 ppm of Cr is detected with an about 700 μm spatial resolution. Spatially resolved elemental analysis of a mug painted with blue, red, green, and white is performed using the two portable spectromicroscopes, and the difference in elemental composition at each paint is detected.

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1221
Journal Issue
1
Journal Page Range
p. 24-29
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
20. international congress on X-ray optics and microanalysis
Dates
15-18 Sep 2009
Place
Karlsruhe (Germany)

Optional Information

Notes
(c) 2010 American Institute of Physics