CAMP - a permanent user endstation for X-ray imaging and pump-probe experiments at FLASH
Creators
- 1. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
- 2. Max-Planck-Institut f. Kernphysik, Heidelberg (Germany)
- 3. Technische Universtitaet Berlin, Berlin (Germany)
Description
CAMP is a multi-purpose instrument optimized for imaging and pump-probe experiments with Free-Electron Lasers (FELs) that was developed in the Max Planck Advanced Study Group at the Center for Free-Electron Laser Science (CFEL) in Hamburg and that was employed at the LCLS, FLASH, and SACLA FELs for the last four years. It offers a choice of large-area, single-photon counting X-ray pnCCD imaging detectors as well as various charged particle spectrometers for electron and ion imaging and coincidence experiments. CAMP is now being installed at FLASH BL1, which is being equipped with new micro-focusing KB optics, to become a permanent endstation available to all users. Here we present an overview of the layout and capabilities of this new endstation.
Additional details
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Issue
- Berlin 2014 issue
- Series
- Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 49(2)
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- 78. Annual meeting of the DPG and DPG-Fruehjahrstagung (Spring meeting) of the section on atomic, molecular, and plasma physics and quantum optics (SAMOP)
- Dates
- 14-21 Mar 2014
- Place
- Berlin (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 46117047
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE-COUPLED DEVICES; COINCIDENCE SPECTROMETRY; ELECTRON SPECTROMETERS; FOCUSING; FREE ELECTRON LASERS; HEAVY ION SPECTROMETERS; JUNCTION DETECTORS; OPTICAL PUMPING; OPTICAL SYSTEMS; POSITION SENSITIVE DETECTORS; X-RAY DETECTION; X-RAY LASERS; X-RAY RADIOGRAPHY
- Descriptors DEC
- COINCIDENCE METHODS; COUNTING TECHNIQUES; DETECTION; INDUSTRIAL RADIOGRAPHY; LASERS; MATERIALS TESTING; MEASURING INSTRUMENTS; NONDESTRUCTIVE TESTING; PUMPING; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SPECTROMETERS; TESTING
Optional Information
- Notes
- Session: A 35.11 Mi 16:30; No further information available
- Collaborations
- CAMP collaboration