X-ray Phase Contrast analysis - Digital wavefront development
Creators
- 1. Metrology Beamline, Synchrotron SOLEIL, Gif-sur-Yvette (France)
- 2. Universite Paul Sabatier-Toulouse III, Metrology Beamline, Synchrotron SOLEIL, Gif-sur-Yvette (France)
- 3. Phaseview, Palaiseau (France)
- 4. ESRF, Grenoble (France)
- 5. X-ray Optics Section, Raja Ramanna Centre for Advanced Technology, Indore (India)
Description
Optical schemes that enable imaging of the phase shift produced by an object have become popular in the x-ray region, where phase can be the dominant contrast mechanism. The propagation-based technique consists of recording the interference pattern produced by choosing one or several sample-to-detector distances. Pioneering studies, carried out making use of synchrotron radiation, demonstrated that this technique results in a dramatic increase of image contrast and detail visibility, allowing the detection of structures invisible with conventional techniques. An experimental and theoretical study of in-line hard x-ray phase-contrast imaging had been performed. The theoretical description of the technique is based on Fresnel diffraction. As an illustration of the potential of this quantitative imaging technique, high-resolution x-ray phase contrast images of simple objects will be presented.
Additional details
Identifiers
- DOI
- 10.1063/1.3463298;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1234
- Journal Issue
- 1
- Journal Page Range
- p. 677-680
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 10. international conference on radiation instrumentation
- Acronym
- SRI 2009
- Dates
- 27 Sep - 2 Oct 2009
- Place
- Melbourne (Australia)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42007231
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE-COUPLED DEVICES; DETECTION; DIFFRACTION; HARD X RADIATION; IMAGES; INTERFERENCE; PHASE SHIFT; RESOLUTION; SYNCHROTRON RADIATION; X-RAY SPECTRA
- Descriptors DEC
- BREMSSTRAHLUNG; COHERENT SCATTERING; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATIONS; SCATTERING; SEMICONDUCTOR DEVICES; SPECTRA; X RADIATION
Optional Information
- Notes
- (c) 2010 American Institute of Physics