Published June 23, 2010 | Version v1
Journal article

X-ray Phase Contrast analysis - Digital wavefront development

  • 1. Metrology Beamline, Synchrotron SOLEIL, Gif-sur-Yvette (France)
  • 2. Universite Paul Sabatier-Toulouse III, Metrology Beamline, Synchrotron SOLEIL, Gif-sur-Yvette (France)
  • 3. Phaseview, Palaiseau (France)
  • 4. ESRF, Grenoble (France)
  • 5. X-ray Optics Section, Raja Ramanna Centre for Advanced Technology, Indore (India)

Description

Optical schemes that enable imaging of the phase shift produced by an object have become popular in the x-ray region, where phase can be the dominant contrast mechanism. The propagation-based technique consists of recording the interference pattern produced by choosing one or several sample-to-detector distances. Pioneering studies, carried out making use of synchrotron radiation, demonstrated that this technique results in a dramatic increase of image contrast and detail visibility, allowing the detection of structures invisible with conventional techniques. An experimental and theoretical study of in-line hard x-ray phase-contrast imaging had been performed. The theoretical description of the technique is based on Fresnel diffraction. As an illustration of the potential of this quantitative imaging technique, high-resolution x-ray phase contrast images of simple objects will be presented.

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1234
Journal Issue
1
Journal Page Range
p. 677-680
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
10. international conference on radiation instrumentation
Acronym
SRI 2009
Dates
27 Sep - 2 Oct 2009
Place
Melbourne (Australia)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42007231
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHARGE-COUPLED DEVICES; DETECTION; DIFFRACTION; HARD X RADIATION; IMAGES; INTERFERENCE; PHASE SHIFT; RESOLUTION; SYNCHROTRON RADIATION; X-RAY SPECTRA
Descriptors DEC
BREMSSTRAHLUNG; COHERENT SCATTERING; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATIONS; SCATTERING; SEMICONDUCTOR DEVICES; SPECTRA; X RADIATION

Optional Information

Notes
(c) 2010 American Institute of Physics