Published June 1, 2009 | Version v1
Journal article

Spatial profile monitors for keV and MeV antiproton beams

Creators

  • 1. Department of Physics, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan)
  • 2. Max-Planck-Institut fuer Quantenoptik, Hans-Kopfermann-Strasse 1, D-85748 Garching (Germany)

Description

A parallel plate ionization chamber and a secondary electron emission detector were developed to non-destructively measure the spatial profiles of antiproton beams with kinetic energies K=5-21MeV. The position-sensitive electrodes in these monitors were manufactured by using a laser trimmer to cut strip patterns on metalized polyester foils. Microwire secondary electron emission detectors were also developed to measure antiprotons at the lowest (K=10-100keV) energies. This detector was operated in ultrahigh vacuum (p∼10-8Pa), low temperatures (T<100K), and strong magnetic fields (B>0.1T).

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2009.01.159

Additional details

Identifiers

DOI
10.1016/j.nima.2009.01.159;
PII
S0168-9002(09)00140-5;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
604
Journal Issue
1-2
Journal Page Range
p. 154-157
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
8. international conference on position sensitive detectors
Acronym
PSD8
Dates
1-5 Sep 2008
Place
Glascow, Scotland (United Kingdom)

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.