Published February 1986
| Version v1
Journal article
Parameters affecting the TSEE of BeO dosemeters
Description
BeO has been used for TSEE dosemeters over two decades. Its exoelectron properties are not uniform. The paper reviews bulk and surface properties of importance for exoelectron emission and dosimetric applications. (author)
Additional details
Publishing Information
- Journal Title
- Jpn. J. Appl. Phys., Suppl.
- Journal Volume
- 24
- Journal Issue
- 4
- Series
- Jpn. J. Appl. Phys., Suppl.
- Journal Page Range
- 248-253
- ISSN
- 0021-4922
- CODEN
- JJPYA
Conference
- Title
- 8. international symposium on exoelectron emission and applications.
- Dates
- 25-30 Aug 1985.
- Place
- Osaka (Japan).
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 18032874
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BERYLLIUM OXIDES; CERAMICS; EXOELECTRON DOSEMETERS; GRAIN SIZE; HUMIDITY; IMPURITIES; SENSITIVITY; STIMULATED EMISSION; SURFACES; TEMPERATURE DEPENDENCE; WATER VAPOR
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; BERYLLIUM COMPOUNDS; CHALCOGENIDES; CRYSTAL STRUCTURE; DOSEMETERS; EMISSION; ENERGY-LEVEL TRANSITIONS; FLUIDS; GASES; MEASURING INSTRUMENTS; MICROSTRUCTURE; OXIDES; OXYGEN COMPOUNDS; SIZE; VAPORS