Published September 2014
| Version v1
Miscellaneous
Restricted
Transparent amorphous oxide thin films: advanced characterization by spectroscopic ellipsometry and X-ray reflectivity
Creators
- 1. Lab. of Multifunctional Materials and Structures, National Inst. of Materials Physics, RO-077125, Magurele-Bucharest (Romania)
- 2. Laser-Surface-Plasma Interactions Lab., Lasers Dept/, National Inst. for Lasers, Plasma and Radiation Physics, RO-077125, Magurele-Bucharest (Romania)
Description
no abstract available
Files
Restricted
The record is publicly accessible, but files are restricted to users with access.
Additional details
Publishing Information
- Imprint Place
- Chisinau (Moldova, Republic of)
- Imprint Title
- 7. International conference on materials science and condensed matter physics. Abstracts
- Imprint Pagination
- 361 p.
- Journal Page Range
- p. 260
- Report number
- INIS-MD--018
Conference
- Title
- 7. International conference on materials science and condensed matter physics. Abstracts
- Dates
- 16-19 Sep 2014
- Place
- Chisinau (Moldova, Republic of)
INIS
- Country of Publication
- Moldova, Republic of
- Country of Input or Organization
- Moldova, Republic of
- INIS RN
- 45104963
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- AMORPHOUS STATE; ELLIPSOMETRY; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; REFLECTIVITY; THIN FILMS; X-RAY EMISSION ANALYSIS
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL ANALYSIS; FILMS; MEASURING METHODS; NONDESTRUCTIVE ANALYSIS; OPTICAL PROPERTIES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SURFACE PROPERTIES