Direct measurement of the PSF for Coulomb delocalization – a reconsideration
- 1. Physics Department, University of Alberta, Edmonton, Canada T6G 2E1 (Canada)
- 2. CAMTEC, University of Victoria, Canada V8W 2Y2 (Australia)
- 3. Microscopy Facility, University of Victoria, Canada V8W 2Y2 (Australia)
- 4. Materials Science, Brookhaven National Laboratory, Upton, NY 11973 (United States)
Description
Highlight• Coulomb delocalization represents the radial extent of forces between a primary electron and atomic electrons within a thin specimen. • It also represents the specimen region over which information about the specimen is integrated, and the region over which energy is initially deposited. • It does not represent the region over which inelastic scattering takes place, or the region from which scattered electrons appear to originate. • The Coulomb point spread function cannot be measured as a broadening of the inelastic image of a small probe. An interpretation of Coulomb delocalization, which limits the spatial resolution of inelastic TEM or STEM images, is given. We conclude that the corresponding point spread function cannot be measured as a broadening of a STEM probe.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2021.113374Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2021.113374;
- PII
- S0304399121001558;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 230
- Journal Page Range
- vp.
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54112302
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ELECTRON BEAMS; ELECTRONS; INELASTIC SCATTERING; RADIOLYSIS; SPATIAL RESOLUTION; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- BEAMS; CHEMICAL RADIATION EFFECTS; CHEMICAL REACTIONS; DECOMPOSITION; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; FERMIONS; LEPTON BEAMS; LEPTONS; MICROSCOPY; PARTICLE BEAMS; RADIATION EFFECTS; RESOLUTION; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2021 Elsevier B.V. All rights reserved.