Published July 2007 | Version v1
Journal article

Time-resolved x-ray absorption spectroscopy using wavelength dispersive XAFS technique

  • 1. High Energy Accelerator Research Organization, Inst. of Materials Structure Science, Tsukuba, Ibaraki (Japan)

Description

The time-resolved X-ray absorption spectroscopy is a powerful technique to dynamically elucidate the local structure and the electronic state of a target element during the fast reaction processes. The wavelength-dispersive XAFS (DXAFS) method attracts great attention for the mechanistic researches, because it is the only technique to apply to the single-action processes, which are difficult to repeat. Recent developments of the DXAFS instrument enable us to perform the time-resolved applications in sub-nano second time region by utilizing the pulse characteristics of synchrotron radiation. This report introduces the concept, the technical details, and the limitations for the utilization of the DXAFS technique. (author)

Additional details

Publishing Information

Journal Title
Hoshako
Journal Volume
20
Journal Issue
4
Journal Page Range
p. 242-249
ISSN
0914-9287

Optional Information

Notes
30 refs., 6 figs.