Measurements of high-energy deuterons in the plasma-focus device
Creators
- 1. Lawrence Livermore Laboratory, University of California, Livermore, California 94550
Description
Nuclear activation techniques have been used to measure the fluence of high-energy deuterons in a plasma-focus device. Substantial activation of carbon and aluminum targets was observed on most shots where the deuterium pressure was less than 3 Torr. Carbon activation indicates more than 1015 deuterons above 330 keV on some high-intensity shots. These deuterons are strongly forward directed with 00 to 900 ratios exceeding 104 on high-yield shots. Ratios of 13N to 28Al, foil-stack activation measurements, and neutron time of flight all consistently show some deuterons have energies above 2 MeV. Measured 13N/28Al ratios also indicate more than 1012 deuterons of energy greater than 5 MeV, but this result has not been verified by an independent threshold-activation measurement. These measurements illustrate that the plasma-focus device can be operated in two distinctly different modes, with low-pressure operation resulting in the acceleration of ions and electrons to many times the capacitor-bank charging voltage. Most of the neutron emission in low-pressure operation may come from beam-target reactions
Additional details
Identifiers
- DOI
- 10.1063/1.325045;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 49
- Journal Issue
- 3
- Series
- J. Appl. Phys.
- Journal Page Range
- 1099-1105
- ISSN
- 0021-8979
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 9396712
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- ACTIVATION ANALYSIS; ALUMINIUM; ANGULAR DISTRIBUTION; BEAM-PLASMA SYSTEMS; CARBON; DEUTERONS; ENERGY SPECTRA; FOILS; NEUTRON EMISSION; NUCLEAR REACTION ANALYSIS; OPERATION; PLASMA DIAGNOSTICS; PLASMA FOCUS DEVICES; PLASMA PRODUCTION; PRESSURE DEPENDENCE; SENSITIVITY; TIME-OF-FLIGHT METHOD
- Descriptors DEC
- CHARGED PARTICLES; CHEMICAL ANALYSIS; DISTRIBUTION; ELEMENTS; EMISSION; METALS; NONMETALS; OPEN PLASMA DEVICES; SPECTRA; THERMONUCLEAR DEVICES
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent