Published June 2004 | Version v1
Miscellaneous Metadata-only

The establishment of high energy heavy ion beam irradiation system and RBS-channeling system in Van-de-Graaff accelerator laboratory at Tokyo Institute of Technology

Creators

  • 1. Kanagawa Univ., Faculty of Science, Hiratsuka, Kanagawa (Japan)
  • 2. Tokyo Inst. of Technology, Graduate School of Science and Engineering, Tokyo (Japan)
  • 3. Tokyo Inst. of Technology, Research Laboratory for Nuclear Reactor, Tokyo (Japan)

Description

We have settled MeV-ion-beam irradiation system and RBS-channeling system in Van-de-Graaff accelerator laboratory at Tokyo Institute of Technology. The purpose of settlement for this system is to change properties of various materials using MeV heavy-ion-beam irradiation and to analyze these by Rutherford Backscattering, channeling, particle induced X-ray emission analysis, and nuclear reaction analysis using MeV light ions such as H, and He. For application, n-type electrical activation of diamond semiconductors using MeV heavy-ion-beam irradiation is one of the main purposes. (author)

Part of:
Proceedings of the sixth symposium on accelerator and related technology for application

Additional details

Publishing Information

Imprint Title
Proceedings of the sixth symposium on accelerator and related technology for application
Imprint Pagination
90 p.
Journal Page Range
p. 49-52

Conference

Title
6. symposium on accelerator and related technology for application
Acronym
ARTA 2004
Dates
17-18 Jun 2004
Place
Tokyo (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
41042054
Subject category
S43: PARTICLE ACCELERATORS; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
ACCELERATOR FACILITIES; BEAM TRANSPORT; CHANNELING; HEAVY IONS; ION BEAMS; IRRADIATION PLANTS; MATERIALS TESTING; PIXE ANALYSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; THICKNESS; THIN FILMS; TITANIUM; VAN DE GRAAFF ACCELERATORS
Descriptors DEC
ACCELERATORS; BEAMS; CHARGED PARTICLES; CHEMICAL ANALYSIS; DIMENSIONS; ELECTROSTATIC ACCELERATORS; ELEMENTS; FILMS; IONS; METALS; NONDESTRUCTIVE ANALYSIS; NUCLEAR FACILITIES; SPECTROSCOPY; TESTING; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS

Optional Information

Notes
8 figs.