Published 1996
| Version v1
Miscellaneous
Positron beam study of technological films
Creators
Description
no abstract available
Availability note (English)
Available from British Library Document Supply Centre- DSC:DXN017767Additional details
Publishing Information
- Imprint Pagination
- 196 p.
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 31046600
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- No Abstract, Thesis, Non-conventional Literature
- Descriptors DEI
- CRYSTAL DEFECTS; CRYSTAL LATTICES; POSITRON COMPUTED TOMOGRAPHY; SILICON; THIN FILMS
- Descriptors DEC
- COMPUTERIZED TOMOGRAPHY; CRYSTAL STRUCTURE; DIAGNOSTIC TECHNIQUES; ELEMENTS; EMISSION COMPUTED TOMOGRAPHY; FILMS; SEMIMETALS; TOMOGRAPHY