Structural properties of ternary buffer films based upon CuAlTe2

Thin films of CuAlTe2 were elaborated by a sequential deposition of three elements Cu; Al and Te under secondary vacuum on glass slides followed by an annealing of 1/2 hour in an open tube within argon atmosphere. The X-rays diffraction diagram depicts a (112) preferential orientation and the presence of low intensities peaks characterizing the chalcopyrite structure. This shows that the majority of crystallites are directed towards the (112) direction with an orientation factor having an approximate value of 70%. The height of the crystallites has been assessed using a scanning electron microscope and found to be larger than 200nm.