Published March 21, 1999 | Version v1
Journal article

High rate behavior and discharge limits in micro-pattern detectors

  • 1. CERN, PPE Division, CH-1211, Geneva 23 (Switzerland)
  • 2. University of Liverpool, Liverpool (United Kingdom)
  • 3. Budker Institute for Nuclear Physics, Novosibirsk (Russian Federation)
  • 4. DESY-University, Hamburg (Germany)
  • 5. ULB-VUB, Bruxelles (Belgium)
  • 6. University of Karlsruhe, Karlsruhe (Germany)
  • 7. GSI, Darmstadt (Germany)

Description

We present and discuss a set of systematic measurements, carried out with gaseous proportional micro-pattern detectors, in order to assess their maximum gain when irradiated with high-rate soft X-rays and heavily ionizing alpha particles. The inventory of detectors tested includes: micro-strips, micromegas, micro-dot, gas electron multiplier, CAT (compteur a trous), trench (or groove), micro-CAT (or WELL) detectors, as well as systems with two elements of gaseous amplification in cascade. We confirm the general trend of all single-stage detectors to follow Raether's criterion, i.e. a spontaneous transition from avalanche to streamer, followed by a discharge, when the avalanche size reaches a value of a few 107; a noticeable exception is the micro-dot counter holding more than 108. In multiple structures, where the gain is shared between two devices in cascade, the maximum overall gain under irradiation is increased by at least one order of magnitude; we speculate this to be a consequence of a voltage dependence of Raether's limit, larger for low operating potentials. Our conclusion is that only multiple devices can guarantee a sufficient margin of reliability for operation in harsh LHC running conditions

Additional details

Identifiers

PII
S0168900298013175;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
424
Journal Issue
2-3
Journal Page Range
p. 321-342
ISSN
0168-9002
CODEN
NIMAER

INIS

Optional Information

Copyright
Copyright (c) 1999 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.