Electrical passivation and chemical functionalization of SiC surfaces by chlorine termination
Creators
- 1. Walter Schottky Institut and Physik Department, Technische Universitaet Muenchen, Am Coulombwall 4, 85748 Garching (Germany)
Description
We have developed a straightforward plasma-based method which yields chlorine-terminated n-type 6H-SiC surfaces. Atomic force microscopy shows that the surface roughness is not affected by the plasma processing. Additionally, x-ray photoelectron spectroscopy reveals a significant reduction in oxygen, and a corresponding rise of chlorine core level intensities, following halogen termination. Contact potential difference and surface photovoltage measurements show formation of negative surface dipoles and approximately flat band surface potentials after chlorine termination of (0001) n-type 6H-SiC (built-in voltage Vbi<20 meV). Starting from halogenated surfaces, we demonstrate both ultraviolet light-induced and thermally-induced functionalization with alkene-derived self-assembled organic monolayers.
Additional details
Identifiers
- DOI
- 10.1063/1.3587767;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 98
- Journal Issue
- 18
- Journal Page Range
- p. 182106-182106.3
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42109065
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CHLORINE; DIPOLES; ELECTRIC POTENTIAL; OXYGEN; PASSIVATION; PLASMA; REDUCTION; ROUGHNESS; SEMICONDUCTOR MATERIALS; SILICON CARBIDES; SURFACE POTENTIAL; SURFACES; ULTRAVIOLET RADIATION; VISIBLE RADIATION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; CHEMICAL REACTIONS; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTS; HALOGENS; MATERIALS; MICROSCOPY; MULTIPOLES; NONMETALS; PHOTOELECTRON SPECTROSCOPY; POTENTIALS; RADIATIONS; SILICON COMPOUNDS; SPECTROSCOPY; SURFACE PROPERTIES
Optional Information
- Notes
- (c) 2011 American Institute of Physics