Published October 1999
| Version v1
Journal article
Elimination of self-absorption in fluorescence hard-x-ray absorption spectra
Creators
- 1. Institut fuer Physik, University of Augsburg, D-86159 Augsburg (Germany)
- 2. Department of Physics, Hunter College, City University of New York, 695 Park Avenue, New York, New York 10021 (United States)
- 3. Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States)
- 4. Naval Research Laboratory, Condensed Matter Branch, Washington, DC 20375 (United States)
Description
Fluorescence detection is a convenient way to measure x-ray absorption spectra in situations where samples cannot be made in the required configuration. However, self-absorption effects cause considerable distortion of spectra measured in fluorescence. We describe a straightforward procedure to correct for such distortion in the hard-x-ray region using the known energy dependence of the x-ray absorption coefficients. This procedure is used to obtain the vanadium K-edge spectrum of single crystal V2O3 and we demonstrate that self-absorption is properly corrected. This facilitates the use of fluorescence detection even in the hard-x-ray region. copyright 1999 The American Physical Society
Additional details
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter
- Journal Volume
- 60
- Journal Issue
- 13
- Journal Page Range
- p. 9335-9339
- ISSN
- 0163-1829
- CODEN
- PRBMDO
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 31002329
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABSORPTION SPECTRA; FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; HARD X RADIATION; K SHELL; SELF-ABSORPTION; VANADIUM COMPOUNDS; VANADIUM OXIDES; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTRA
- Descriptors DEC
- ABSORPTION; CHALCOGENIDES; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELECTRONIC STRUCTURE; EMISSION; EMISSION SPECTROSCOPY; IONIZING RADIATIONS; LUMINESCENCE; NONDESTRUCTIVE ANALYSIS; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; RADIATIONS; SORPTION; SPECTRA; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS; VANADIUM COMPOUNDS; X RADIATION; X-RAY EMISSION ANALYSIS