Published August 1988 | Version v1
Journal article Metadata-only

Angle-dependent x-ray photoelectron spectroscopy studies of epitaxial layers on single-crystal substrates

Creators

  • 1. Council for Scientific and Industrial Research, Pretoria (South Africa). National Inst. for Materials Research

Description

In this paper it is shown how angle-dependent X-ray photoelectron spectroscopy (AXPS) can be used as a new tool for studying lattice mismatch between epilayers and substrates. The factors causing AXPS are discussed, and examples given to illustrate the usefulness of AXPS in mismatch studies of epilayers grown by OMVPE and LPE

Additional details

Publishing Information

Journal Title
South African Journal of Science
Journal Volume
84
Journal Issue
8
Series
S. Afr. J. Sci.
Journal Page Range
685-687
ISSN
0038-2353
CODEN
SAJSA

INIS

Country of Publication
South Africa
Country of Input or Organization
South Africa
INIS RN
20031184
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
CRYSTAL LATTICES; EPITAXY; MONOCRYSTALS; PHOTOELECTRON SPECTROSCOPY; SUBSTRATES; X-RAY SPECTROSCOPY
Descriptors DEC
CRYSTAL STRUCTURE; CRYSTALS; ELECTRON SPECTROSCOPY; SPECTROSCOPY