Published January 31, 2005
| Version v1
Journal article
Preparation and microstructures of FeSiBNbCu thin films
Creators
- 1. Nano-Center, Department of Physics, East China Normal University, Shanghai 200062 (China)
Description
We have prepared FeSiBNbCu thin films by radio frequency (RF) magnetron sputtering and investigated the influence of the sputtering power on the microstructures of FeSiBNbCu thin films through analyzing their microstructural configurations by X-ray diffraction (XRD) and Mossbauer spectroscopy. The results showed that FeSiBNbCu thin films were amorphous when deposited with low sputtering power density and exhibited the mixed structure of crystalline and amorphous components with increasing the sputtering power density, without any heat treatment. The crystallites contained nanosized α-Fe(Si) and α-Fe(B) solid solutions of which the volume fractions and the microstructural configurations changed with the sputtering power
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2004.10.098;
- PII
- S0921-4526(04)01111-1;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 355
- Journal Issue
- 1-4
- Journal Page Range
- p. 182-187
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36058050
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BORON; COPPER; HEAT TREATMENTS; IRON-ALPHA; MAGNETRONS; MICROSTRUCTURE; MOESSBAUER EFFECT; NANOSTRUCTURES; NIOBIUM; RADIOWAVE RADIATION; SILICON; SOLID SOLUTIONS; SPUTTERING; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; DISPERSIONS; ELECTROMAGNETIC RADIATION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; HOMOGENEOUS MIXTURES; IRON; METALS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; MIXTURES; RADIATIONS; REFRACTORY METALS; SCATTERING; SEMIMETALS; SOLUTIONS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.