Published December 1986 | Version v1
Journal article Metadata-only

High resolution EXAFS-XANES spectrometer

Creators

  • 1. INFN, Laboratori Nazionali di Frascati, Frascati (Italy)
  • 2. Commission of the European Communities, Ispra (Italy). Joint Research Centre

Description

A double crystal (n, +n asymmetric) spectrometer with high resolution for analysing near edge XANES and EXAFS spectra is described. The spectra obtained on this instrument using a rotating anode source compare favourably with those obtained at a synchrotron

Additional details

Publishing Information

Journal Title
J. Phys. (Les Ulis), Colloq.
Journal Volume
47
Journal Issue
c8-v.1
Series
J. Phys. (Les Ulis), Colloq.
Journal Page Range
117-120
ISSN
0449-1947
CODEN
JPQCA

Conference

Title
4. International conference on EXAFS and near edge structure IV.
Dates
7-11 Jul 1986.
Place
Fontevraud (France).

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
18091035
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION SPECTRA; ENERGY RESOLUTION; EV RANGE 01-10; X-RAY SPECTROMETERS; X-RAY SPECTROSCOPY
Descriptors DEC
ENERGY RANGE; EV RANGE; MEASURING INSTRUMENTS; RESOLUTION; SPECTRA; SPECTROMETERS; SPECTROSCOPY