A high dynamic range method for the direct readout of a dynamic phase change in homodyne interferometers
- 1. Department of Electrical Engineering, Faculdade de Engenharia de Ilha Solteira, UNESP— Universidade Estadual Paulista, Av. Brasil, 56, 15385-000—Ilha Solteira, SP (Brazil)
- 2. IPT—Instituto de Pesquisas Tecnológicas, Centro de Metrologia de Fluidos, Rua Prof. Almeida Prado, 532, Cidade Universitária, 05508-901—São Paulo, SP (Brazil)
- 3. Department of Mechatronics and Mechanical Systems Engineering, Escola Politécnica da Universidade de São Paulo—EPUSP, Av. Prof. Mello Moraes, 2231, 05508-900-–São Paulo, SP (Brazil)
Description
Piezoelectric flextensional actuators (PFAs) are an efficient alternative to systems that demand nano-positioning of devices, such as in nanotechnology. Optical techniques constitute an excellent choice for contactless measurement of nano-displacements. In particular, optical interferometry constitutes an adequate choice for characterizing PFAs. There are several types of interferometers, as well as optical phase demodulation methods, used in practice. One interesting class of demodulation methods uses the spectrum of the photo-detected signal and its intrinsic properties when there is a harmonically varying time-domain modulating signal. In this work, a low cost homodyne Michelson interferometer, associated with simple electronic circuits for signal conditioning and acquisition, is used. A novel dynamic phase demodulation method, named Jm and Jm+2, is proposed, which uses only the magnitude spectrum of the photo-detected signal, without the need to know its phase spectrum. The method is passive, direct, self-consistent, without problems of phase ambiguity and immune to fading, and presents a dynamic range from 0.45 to 100 rad displacements (between 22.6 nm and 5 µm, for λ = 632.8 nm). When applied to the measurement of half-wave voltage in a proof-of-concept Pockels cell, it presents errors smaller than 0.9% when compared to theory. For the estimation of PFA displacement, it allows the measurement of linearity and frequency response curves, with excellent results. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-0233/23/12/125201Additional details
Identifiers
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 23
- Journal Issue
- 12
- Journal Page Range
- [12 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46013291
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACTUATORS; APPROPRIATE TECHNOLOGY; COMPARATIVE EVALUATIONS; DATA ACQUISITION; DIAGRAMS; ELECTRIC POTENTIAL; ELECTRONIC CIRCUITS; INTERFEROMETRY; MICHELSON INTERFEROMETER; NANOSTRUCTURES; PIEZOELECTRICITY; POCKELS CELL; POSITIONING; READOUT SYSTEMS; SIGNAL CONDITIONING; SIGNALS
- Descriptors DEC
- ELECTRICITY; EVALUATION; INFORMATION; INTERFEROMETERS; MEASURING INSTRUMENTS