Published 1984
| Version v1
Miscellaneous
Mossbauer and X ray diffraction studies in (In16Te84)1-x Shx and (Ge85Te15)1-x Shx amorphous alloys
Description
Solid samples of both alloys were obtained by means of splat-cooling techniques (q = 105 - 106 K/s) (1). The material was cooled down from different initial temperatures (T0) of the liquid state and the samples were analized by Moessbauer Spectroscopy (SnO3Ba source at room temperature) and X Ray diffraction (powder diagrams using a Debye chamber). (author)
Abstract (Portuguese)
Amostras solidas de ambas as ligas (In16Te84)1-x Shx e (Ge85Te15)1-x Snx foram obtidas pela tecnica de splat-cooling (q = 105 -106 K/s). O material foi resfriado de temperaturas iniciais (T0) diferentes do estado liquido e as amostras foram analizadas por espectros copia Moessbauer fonte de (Sh O3Ba a temperatura ambiente) e difracao de raios X (diagramas de po usando camara de Debye). (A.C.A.S.)Additional details
Additional titles
- Original title (no language)
- Anais do Simposio Latino Americano de Fisica dos Sistemas Amorfos. v. 2.
Publishing Information
- Imprint Title
- Proceedings of the Latin American Symposium on Physics of Amorphous Systems. v. 2
- Imprint Pagination
- 266 p.
- Journal Page Range
- p. 434-437.
- Report number
- INIS-BR--2352
Conference
- Title
- Latin American Symposium on Physics of Amorphous Systems.
- Dates
- 27 Feb - 2 Mar 1984.
- Place
- Niteroi, RJ (Brazil).
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 22000478
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMORPHOUS STATE; GERMANIUM BASE ALLOYS; INDIUM BASE ALLOYS; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; DIFFRACTION; GERMANIUM ALLOYS; INDIUM ALLOYS; SCATTERING
Optional Information
- Notes
- Imprint:Anais do Simposio Latino Americano de Fisica dos Sistemas Amorfos. v. 2.