Published January 1980 | Version v1
Journal article

Exodiffusion of hydrogen in amorphous silicon

  • 1. Paris-7 Univ., 75 (France). Groupe de Physique des Solides
  • 2. CEA Centre d'Etudes Nucleaires de Grenoble, 38 (France)
  • 3. CEA Centre d'Etudes Nucleaires de Grenoble, 38 (France). Dept. de Recherche Fondamentale

Description

The exodiffusion of hydrogen in a-Si prepared by silane decomposition has been previously studied using H(B11,α)αα nuclear reaction and conductivity measurements which show that it takes place in two stages, one centered at 723 K, the other at 853 K. The first stage is due to the diffusion of 'weakly' bond H. The second stage which we study quantitatively here by EPR, has an activation energy of 3.6 eV corresponding to the liberation of a bond hydrogen. The fact that the EPR signal is related to the second stage governed by a process whose activation energy is equal to the Si-H bond energy is a direct evidence that the EPR signal is associated with dangling bonds which were saturated by hydrogen. (orig.)

Additional details

Publishing Information

Journal Title
J. Non-Cryst. Solids
Journal Volume
35/36
Journal Issue
pt.1
Series
J. Non-Cryst. Solids.
Journal Page Range
225
ISSN
0022-3093