Published September 1, 2008 | Version v1
Journal article

AlGaAs diodes for X-ray spectroscopy

  • 1. Space Research Centre, Department of Physics and Astronomy, Michael Atiyah Building, University of Leicester, Leicester LE1 7RH (United Kingdom)
  • 2. Department of Electronic and Electrical Engineering, University of Sheffield, Mappin Street, Sheffield S1 3JD (United Kingdom)

Description

Al0.8Ga0.2As p+-p--n+ diodes with low reverse leakage currents (<10 nA) were evaluated as room temperature (23 deg. C), soft X-ray photon-counting detectors. X-ray spectra from a 55Fe radioactive source show these diodes can be used for spectroscopy with promising energy resolution of 1.47 keV FWHM at 5.9 keV. At elevated reverse bias levels (>20 V), we observed avalanche multiplication which, while improving the signal-to-noise ratio, degraded the spectroscopic performance

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2008.06.038

Additional details

Identifiers

DOI
10.1016/j.nima.2008.06.038;
PII
S0168-9002(08)00864-4;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
594
Journal Issue
2
Journal Page Range
p. 202-205
ISSN
0168-9002
CODEN
NIMAER

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.