Published April 2016 | Version v1
Journal article

Impact ionization in nonuniformly heated silicon p+–n–n+ and n+–p–p+ structures

Creators

  • 1. Russian Academy of Sciences, Amirkhanov Institute of Physics, Dagestan Scientific Center (Russian Federation)

Description

Experimental results on the effects of changes in the impact-ionization current in silicon diffusion p+–n–n+ and n+–p–p+ structures upon nonuniform heating are presented. It is shown that the revealed effects are associated with the transformation of band energy levels caused by thermoelastic stresses of the structures.

Additional details

Identifiers

Publishing Information

Journal Title
Semiconductors
Journal Volume
50
Journal Issue
4
Journal Page Range
p. 462-465
ISSN
1063-7826
CODEN
SMICES

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48094158
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
BAND THEORY; DIFFUSION; ELECTRIC CURRENTS; ELECTRONIC STRUCTURE; ENERGY LEVELS; HEATING; IONIZATION; P-N JUNCTIONS; SILICON; STRESSES; THERMOELASTICITY
Descriptors DEC
CURRENTS; ELASTICITY; ELEMENTS; MECHANICAL PROPERTIES; SEMICONDUCTOR JUNCTIONS; SEMIMETALS

Optional Information

Copyright
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