Published 2002
| Version v1
Journal article
MACS low-background doubly focusing neutron monochromator
Creators
- 1. Oak Ridge National Laboratory, Spallation Neutron Source, Oak Ridge, TN 37830 (United States)
- 2. Department of Physics and Astronomy, Johns Hopkins University, Baltimore, MD 21218 (United States)
- 3. National Institute of Standards and Technology, Gaithersburg, MD 20899 (United States)
- 4. Department of Mechanical Engineering, University of Maryland, College Park, MD 20742 (United States)
Description
A novel doubly focusing neutron monochromator has been developed as part of the Multi-Analyzer Crystal Spectrometer (MACS) at the NIST Center for Neutron Research. The instrument utilizes a unique vertical focusing element that enables active vertical and horizontal focusing with a large, 357-crystal (1428 cm2), array. The design significantly reduces the amount of structural material in the beam path as compared to similar instruments. Optical measurements verify the excellent focal performance of the device. Analytical and Monte Carlo simulations predict that, when mounted at the NIST cold-neutron source, the device should produce a monochromatic beam (ΔE=0.2 meV) with flux φ>108 n/cm2 s. (orig.)
Availability note (English)
Available from: http://dx.doi.org/10.1007/s003390201658Additional details
Identifiers
Publishing Information
- Journal Title
- Applied Physics. A, Materials Science and Processing
- Journal Volume
- 74
- Journal Issue
- 1,Suppl
- Journal Page Range
- p. s255-s257
- ISSN
- 0947-8396
- CODEN
- APAMFC
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 34024410
- Subject category
- S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- BEAM TRANSPORT; COLD NEUTRONS; FOCUSING; MONOCHROMATORS; NEUTRON BEAMS; NEUTRON FLUX; NEUTRON SOURCES; NEUTRON SPECTROMETERS
- Descriptors DEC
- BARYONS; BEAMS; ELEMENTARY PARTICLES; FERMIONS; HADRONS; MEASURING INSTRUMENTS; NEUTRONS; NUCLEON BEAMS; NUCLEONS; PARTICLE BEAMS; PARTICLE SOURCES; RADIATION FLUX; RADIATION SOURCES; SPECTROMETERS
Optional Information
- Notes
- With 3 figs., 5 refs.