Published December 1, 1984
| Version v1
Journal article
Substrate signal suppression in Raman spectra of sputter deposited TiO2 films
Description
Polarized Raman scattering measurements of thin sputter deposited TiO2 films on silica substrates are reported and demonstrate supression of substrate Raman scattering when one specific component of the scattered radiation is analyzed
Additional details
Publishing Information
- Journal Title
- J. Chem. Phys.
- Journal Volume
- 81
- Journal Issue
- 11
- Series
- J. Chem. Phys.
- Journal Page Range
- 5211-5213
- ISSN
- 0021-9606
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 16049660
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COATINGS; FILMS; POLARIZATION; RAMAN SPECTRA; SILICON OXIDES; SUBSTRATES; TITANIUM OXIDES
- Descriptors DEC
- CHALCOGENIDES; OXIDES; OXYGEN COMPOUNDS; SILICON COMPOUNDS; SPECTRA; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS