Published July 2004
| Version v1
Journal article
A 2π spectrometer for electron-electron coincidence studies on surfaces
Creators
- 1. Institut fuer Kernphysik, J.W. Goethe Universitaet Frankfurt, August-Euler-Str.6, 60486 Frankfurt (Germany)
Description
We present a new time-of-flight spectrometer for energy and angle-resolved measurements of electrons emitted in coincidence from a surface. By using a projection method, we can cover nearly 2π of the solid angle above the sample resulting in a very high coincidence efficiency. The use of this new spectrometer for the double photoemission process from surfaces will be demonstrated
Additional details
Identifiers
- DOI
- 10.1063/1.1765764;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 75
- Journal Issue
- 7
- Journal Page Range
- p. 2373-2378
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36030575
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ELECTRON SPECTROMETERS; ELECTRON-ELECTRON COLLISIONS; ELECTRON-ELECTRON COUPLING; ELECTRON-ELECTRON INTERACTIONS; PHOTOEMISSION; SOLIDS; SURFACES; TIME-OF-FLIGHT SPECTROMETERS
- Descriptors DEC
- COLLISIONS; COUPLING; ELECTRON COLLISIONS; EMISSION; INTERACTIONS; LEPTON-LEPTON INTERACTIONS; MEASURING INSTRUMENTS; PARTICLE INTERACTIONS; SECONDARY EMISSION; SPECTROMETERS
Optional Information
- Notes
- (c) 2004 American Institute of Physics.