Published July 2019 | Version v1
Journal article

Quantum interference effects in titanium nitride films at low temperatures

  • 1. Department of Mechanical Engineering, North Carolina A & T State University, Greensboro, NC 27411 (United States)
  • 2. Aerospace Systems Directorate (AFRL/RQTI), 1950 Fifth Street, Bldg. 18 D, Wright-Patterson AFB, OH 45433 (United States)
  • 3. Department of Mechanical Engineering, Engineering Research Center, North Carolina A&T State University, Greensboro, NC 27411 (United States)
  • 4. Harish-Chandra Research Institute (HRI), Allahabad 211 019 (India)

Description

Highlights: • The resistivity minimum observed in non-magnetic stoichiometric TiN thin film system. • The resistivity minima is independent of the nature of disorder. • Below the minima, the resistivity is described by quantum interference effect. -- Abstract: Detailed electrical resistivity (ρ) measurements have been carried out in epitaxial TiN thin films in the temperature (T) range of 4 ≤ T ≤ 300 K in magnetic fields from 0 to 6 T. The ρ (T) data show distinct minima around 38 K, which remains unaffected by the external magnetic fields. At higher temperatures (100−300K), the ρ(T) behavior was found to be linear in agreement with classical electron-phonon interactions (∝T). Below the minima, the ρ(T) is unequivocally described by the quantum interference effect (∝ − T). The value of the coefficient of the T term matches well with the near-universal value.

Additional details

Identifiers

DOI
10.1016/j.tsf.2019.05.005;
PII
S0040609019302718;

Publishing Information

Journal Title
Thin Solid Films (Print)
Journal Volume
681
Journal Page Range
p. 1-5
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2019 Elsevier B.V. All rights reserved.