Optical reflectance of insulators containing implanted metal nanoparticles
Creators
Description
Silver nanoparticles have been synthesised by ion implantation in soda-lime silicate glass at 60 keV to a dose of 7x1016 ion/cm2 at a current density of 10 μA/cm2. The silver profile distribution was determined by Rutherford backscattering spectroscopy (RBS). Optical properties of composites were characterised by reflectance measured from both the implanted and the rear face of the sample. For modelling of reflectivity spectra a multilayer structure was considered and a matrix method using complex Fresnel coefficients was applied. Dielectric permeabilities of composite layers were calculated using the Maxwell-Garnet effective medium theory. Agreement between theoretical and experimental reflectivity spectra was achieved by accounting for the non-uniform silver concentration distribution with depth in the implanted glass surface
Additional details
Identifiers
- PII
- S0168583X9900782X;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 161-163
- Journal Issue
- 4
- Journal Page Range
- p. 913-916
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 33049151
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BACKSCATTERING; ELECTRICAL INSULATORS; FRESNEL COEFFICIENT; GLASS; ION IMPLANTATION; KEV RANGE 10-100; REFRACTION; RUTHERFORD SCATTERING; SILVER; SILVER IONS; SPECTRAL REFLECTANCE; VISIBLE RADIATION
- Descriptors DEC
- CHARGED PARTICLES; ELASTIC SCATTERING; ELECTRICAL EQUIPMENT; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY RANGE; EQUIPMENT; IONS; KEV RANGE; METALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2000 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.